PSTC named Michaeleen Pacholski, Research Scientist in Analytical Sciences of Core R&D, The Dow Chemical Company, recipient of its coveted 2015 Carl Dahlquist Award. The award is named for innovator Dahlquist who developed the Dahlquist criterion of tack, determining the modulus value of a material necessary for it to be low enough and tacky enough to be considered a pressure sensitive adhesive.

PSTC presents the Dahlquist Award to one speaker during its annual technical conference who, following the evaluation of a panel of judges, demonstrates the very best in research relating to adhesive tape technology. The selection covers a range of criteria, concentrating on originality and scientific contribution, but also includes presentation and quality of visuals.

Dr. Pacholski presented Correlating Substrate Surface Analysis to Adhesive Performance at the PSTC TECH 38 technical seminar, which took place May 11-15, 2015 in Baltimore, MD.

In her current role, Dr. Pacholski is responsible for various types of surface analysis including Secondary Ion Mass Spectrometry (SIMS), X-Ray Photoelectron Spectroscopy (XPS), surface energy measurements and static and dynamic surface tension. She graduated from SUNY Buffalo with a BS in Chemistry and from Penn State with a Ph.D. in Chemistry in 1999. Pacholski has been with Rohm and Haas/Dow for more than 15 years specializing in analysis involving adhesion, defect analysis, coatability and surface treatments. She serves as an analytical liaison to the adhesives group and has participated in many product development projects.